View source for Category:Shuji HAYASHIDA

== Shuji HAYASHIDA ==

=== Executive Summary ===
Shuji HAYASHIDA is an inventor who has filed 2 patents. Their primary areas of innovation include MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS (1 patents), Measuring arrangements characterised by the use of mechanical techniques (1 patents), MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS (1 patents), and they have worked with companies such as MITUTOYO CORPORATION (2 patents). Their most frequent collaborators include [[Category:Masashi YAMAJI|Masashi YAMAJI]] (2 collaborations), [[Category:Chihiro YAMAMOTO|Chihiro YAMAMOTO]] (2 collaborations), [[Category:Yuhei TAKATSU|Yuhei TAKATSU]] (1 collaborations).

=== Patent Filing Activity ===
[[File:Shuji_HAYASHIDA_Monthly_Patent_Applications.png|border|800px]]

=== Technology Areas ===
[[File:Shuji_HAYASHIDA_Top_Technology_Areas.png|border|800px]]

==== List of Technology Areas ====
* [[:Category:CPC_G01B3/24|G01B3/24]] (MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS): 1 patents
* [[:Category:CPC_G01B5/0007|G01B5/0007]] (Measuring arrangements characterised by the use of mechanical techniques): 1 patents
* [[:Category:CPC_G01B5/06|G01B5/06]] (MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS): 1 patents
* [[:Category:CPC_G01B2210/42|G01B2210/42]] (MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS): 1 patents
* [[:Category:CPC_G01B7/02|G01B7/02]] (MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS): 1 patents
* [[:Category:CPC_G01B7/002|G01B7/002]] (Measuring arrangements characterised by the use of electric or magnetic techniques): 1 patents
* [[:Category:CPC_G01B3/18|G01B3/18]] (MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS): 1 patents
* [[:Category:CPC_G01B3/38|G01B3/38]] (MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS): 1 patents

=== Companies ===
[[File:Shuji_HAYASHIDA_Top_Companies.png|border|800px]]

==== List of Companies ====
* MITUTOYO CORPORATION: 2 patents

=== Collaborators ===
* [[:Category:Masashi YAMAJI|Masashi YAMAJI]][[Category:Masashi YAMAJI]] (2 collaborations)
* [[:Category:Chihiro YAMAMOTO|Chihiro YAMAMOTO]][[Category:Chihiro YAMAMOTO]] (2 collaborations)
* [[:Category:Yuhei TAKATSU|Yuhei TAKATSU]][[Category:Yuhei TAKATSU]] (1 collaborations)
* [[:Category:Keita OGAWA|Keita OGAWA]][[Category:Keita OGAWA]] (1 collaborations)

[[Category:Shuji HAYASHIDA]]
[[Category:Inventors]]
[[Category:Inventors filing patents with MITUTOYO CORPORATION]]