View source for Category:William Tigard BAKER of Redmond WA (US)

== William Tigard BAKER of Redmond WA (US) ==

=== Executive Summary ===
William Tigard BAKER of Redmond WA (US) is an inventor who has filed 4 patents. Their primary areas of innovation include {by runtime analysis  (performance monitoring (1 patents), {Software testing  (software testing in telephone exchanges (1 patents), {using natural language analysis} (1 patents), and they have worked with companies such as Microsoft Technology Licensing, LLC (4 patents). Their most frequent collaborators include [[Category:Dallas Allen WARREN of Redmond WA (US)|Dallas Allen WARREN of Redmond WA (US)]] (4 collaborations), [[Category:Piyush GUPTA of Sammamish WA (US)|Piyush GUPTA of Sammamish WA (US)]] (4 collaborations), [[Category:Aaron Edward DIETRICH of Kirkland WA (US)|Aaron Edward DIETRICH of Kirkland WA (US)]] (4 collaborations).

=== Patent Filing Activity ===
[[File:William_Tigard_BAKER_of_Redmond_WA_(US)_Monthly_Patent_Applications.png|border|800px]]

=== Technology Areas ===
[[File:William_Tigard_BAKER_of_Redmond_WA_(US)_Top_Technology_Areas.png|border|800px]]

==== List of Technology Areas ====
* [[:Category:CPC_G06F11/3612|G06F11/3612]] ({by runtime analysis  (performance monitoring): 1 patents
* [[:Category:CPC_G06F11/3668|G06F11/3668]] ({Software testing  (software testing in telephone exchanges): 1 patents
* [[:Category:CPC_G06F16/3344|G06F16/3344]] ({using natural language analysis}): 1 patents
* [[:Category:CPC_G06F11/3688|G06F11/3688]] ({for test execution, e.g. scheduling of test suites}): 1 patents
* [[:Category:CPC_G06F11/3664|G06F11/3664]] ({Environments for testing or debugging software}): 1 patents
* [[:Category:CPC_G06F11/368|G06F11/368]] ({for test version control, e.g. updating test cases to a new software version}): 1 patents
* [[:Category:CPC_G06F21/577|G06F21/577]] ({Assessing vulnerabilities and evaluating computer system security}): 1 patents
* [[:Category:CPC_G06F2221/033|G06F2221/033]] (Indexing scheme relating to): 1 patents
* [[:Category:CPC_G06F11/263|G06F11/263]] (Generation of test inputs, e.g. test vectors, patterns or sequences {; with adaptation of the tested hardware for testability with external testers}): 1 patents

=== Companies ===
[[File:William_Tigard_BAKER_of_Redmond_WA_(US)_Top_Companies.png|border|800px]]

==== List of Companies ====
* Microsoft Technology Licensing, LLC: 4 patents

=== Collaborators ===
* [[:Category:Dallas Allen WARREN of Redmond WA (US)|Dallas Allen WARREN of Redmond WA (US)]][[Category:Dallas Allen WARREN of Redmond WA (US)]] (4 collaborations)
* [[:Category:Piyush GUPTA of Sammamish WA (US)|Piyush GUPTA of Sammamish WA (US)]][[Category:Piyush GUPTA of Sammamish WA (US)]] (4 collaborations)
* [[:Category:Aaron Edward DIETRICH of Kirkland WA (US)|Aaron Edward DIETRICH of Kirkland WA (US)]][[Category:Aaron Edward DIETRICH of Kirkland WA (US)]] (4 collaborations)
* [[:Category:Swamy V. P. L. N. NALLAMALLI of Bothell WA (US)|Swamy V. P. L. N. NALLAMALLI of Bothell WA (US)]][[Category:Swamy V. P. L. N. NALLAMALLI of Bothell WA (US)]] (2 collaborations)

[[Category:William Tigard BAKER of Redmond WA (US)]]
[[Category:Inventors]]
[[Category:Inventors filing patents with Microsoft Technology Licensing, LLC]]