View source for Category:Yoel Feler

== Yoel Feler ==

=== Executive Summary ===
Yoel Feler is an inventor who has filed 3 patents. Their primary areas of innovation include Subject of image; Context of image processing (2 patents), PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR;  (phototypographic composing devices (1 patents), {for microlithography  (measuring printed patterns for monitoring overlay (1 patents), and they have worked with companies such as KLA Corporation (3 patents). Their most frequent collaborators include [[Category:Mark Ghinovker|Mark Ghinovker]] (2 collaborations), [[Category:Diana Shaphirov|Diana Shaphirov]] (1 collaborations), [[Category:Evgeni Gurevich|Evgeni Gurevich]] (1 collaborations).

=== Patent Filing Activity ===
[[File:Yoel_Feler_Monthly_Patent_Applications.png|border|800px]]

=== Technology Areas ===
[[File:Yoel_Feler_Top_Technology_Areas.png|border|800px]]

==== List of Technology Areas ====
* [[:Category:CPC_G06T2207/30148|G06T2207/30148]] (Subject of image; Context of image processing): 2 patents
* [[:Category:CPC_G03F7/70633|G03F7/70633]] (PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR;  (phototypographic composing devices): 1 patents
* [[:Category:CPC_G03F9/7076|G03F9/7076]] ({for microlithography  (measuring printed patterns for monitoring overlay): 1 patents
* [[:Category:CPC_G06T7/33|G06T7/33]] (using feature-based methods): 1 patents
* [[:Category:CPC_G01B11/272|G01B11/272]] (MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS): 1 patents
* [[:Category:CPC_G06T7/0004|G06T7/0004]] ({Industrial image inspection}): 1 patents
* [[:Category:CPC_G01B11/24|G01B11/24]] (MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS): 1 patents

=== Companies ===
[[File:Yoel_Feler_Top_Companies.png|border|800px]]

==== List of Companies ====
* KLA Corporation: 3 patents

=== Collaborators ===
* [[:Category:Mark Ghinovker|Mark Ghinovker]][[Category:Mark Ghinovker]] (2 collaborations)
* [[:Category:Diana Shaphirov|Diana Shaphirov]][[Category:Diana Shaphirov]] (1 collaborations)
* [[:Category:Evgeni Gurevich|Evgeni Gurevich]][[Category:Evgeni Gurevich]] (1 collaborations)
* [[:Category:Vladimir Levinski|Vladimir Levinski]][[Category:Vladimir Levinski]] (1 collaborations)

[[Category:Yoel Feler]]
[[Category:Inventors]]
[[Category:Inventors filing patents with KLA Corporation]]