Category:Kenji WATANABE: Difference between revisions
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=== Executive Summary === | === Executive Summary === | ||
Kenji WATANABE is an inventor who has filed | Kenji WATANABE is an inventor who has filed 2 patents. Their primary areas of innovation include {Inspection of images, e.g. flaw detection} (1 patents), Topological mapping of higher dimensional structures onto lower dimensional surfaces (1 patents), using local operators (1 patents), and they have worked with companies such as Nuvoton Technology Corporation Japan (2 patents). Their most frequent collaborators include [[Category:Jin MATSUMOTO|Jin MATSUMOTO]] (1 collaborations), [[Category:Katsumi TOKUYAMA|Katsumi TOKUYAMA]] (1 collaborations), [[Category:Mutsumi MATSUURA|Mutsumi MATSUURA]] (1 collaborations). | ||
=== Patent Filing Activity === | === Patent Filing Activity === | ||
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==== List of Technology Areas ==== | ==== List of Technology Areas ==== | ||
* [[:Category: | * [[:Category:CPC_G06T7/0002|G06T7/0002]] ({Inspection of images, e.g. flaw detection}): 1 patents | ||
* [[:Category: | * [[:Category:CPC_G06T3/06|G06T3/06]] (Topological mapping of higher dimensional structures onto lower dimensional surfaces): 1 patents | ||
* [[:Category: | * [[:Category:CPC_G06T5/20|G06T5/20]] (using local operators): 1 patents | ||
* [[:Category:CPC_G06T11/60|G06T11/60]] (Editing figures and text; Combining figures or text): 1 patents | |||
* [[:Category:CPC_H04N25/59|H04N25/59]] (by controlling the amount of charge storable in the pixel, e.g. modification of the charge conversion ratio of the floating node capacitance): 1 patents | |||
* [[:Category:CPC_H04N25/42|H04N25/42]] (by switching between different modes of operation using different resolutions or aspect ratios, e.g. switching between interlaced and non-interlaced mode): 1 patents | |||
* [[:Category:CPC_H04N25/771|H04N25/771]] (comprising storage means other than floating diffusion): 1 patents | |||
* [[:Category:CPC_H04N25/772|H04N25/772]] (comprising A/D, V/T, V/F, I/T or I/F converters): 1 patents | |||
* [[:Category:CPC_H04N25/778|H04N25/778]] (comprising amplifiers shared between a plurality of pixels, i.e. at least one part of the amplifier must be on the sensor array itself): 1 patents | |||
=== Companies === | === Companies === | ||
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==== List of Companies ==== | ==== List of Companies ==== | ||
* | * Nuvoton Technology Corporation Japan: 2 patents | ||
=== Collaborators === | === Collaborators === | ||
* [[:Category: | * [[:Category:Jin MATSUMOTO|Jin MATSUMOTO]][[Category:Jin MATSUMOTO]] (1 collaborations) | ||
* [[:Category: | * [[:Category:Katsumi TOKUYAMA|Katsumi TOKUYAMA]][[Category:Katsumi TOKUYAMA]] (1 collaborations) | ||
* [[:Category: | * [[:Category:Mutsumi MATSUURA|Mutsumi MATSUURA]][[Category:Mutsumi MATSUURA]] (1 collaborations) | ||
* [[:Category: | * [[:Category:Makoto IKUMA|Makoto IKUMA]][[Category:Makoto IKUMA]] (1 collaborations) | ||
* [[:Category:Yutaka ABE|Yutaka ABE]][[Category:Yutaka ABE]] (1 collaborations) | |||
* [[:Category:Takayasu KITO|Takayasu KITO]][[Category:Takayasu KITO]] (1 collaborations) | |||
* [[:Category:Norihiko SUMITANI|Norihiko SUMITANI]][[Category:Norihiko SUMITANI]] (1 collaborations) | |||
[[Category:Kenji WATANABE]] | [[Category:Kenji WATANABE]] | ||
[[Category:Inventors]] | [[Category:Inventors]] | ||
[[Category:Inventors filing patents with | [[Category:Inventors filing patents with Nuvoton Technology Corporation Japan]] | ||
Latest revision as of 05:17, 24 March 2025
Kenji WATANABE
Executive Summary
Kenji WATANABE is an inventor who has filed 2 patents. Their primary areas of innovation include {Inspection of images, e.g. flaw detection} (1 patents), Topological mapping of higher dimensional structures onto lower dimensional surfaces (1 patents), using local operators (1 patents), and they have worked with companies such as Nuvoton Technology Corporation Japan (2 patents). Their most frequent collaborators include (1 collaborations), (1 collaborations), (1 collaborations).
Patent Filing Activity
File:Kenji WATANABE Monthly Patent Applications.png
Technology Areas
File:Kenji WATANABE Top Technology Areas.png
List of Technology Areas
- G06T7/0002 ({Inspection of images, e.g. flaw detection}): 1 patents
- G06T3/06 (Topological mapping of higher dimensional structures onto lower dimensional surfaces): 1 patents
- G06T5/20 (using local operators): 1 patents
- G06T11/60 (Editing figures and text; Combining figures or text): 1 patents
- H04N25/59 (by controlling the amount of charge storable in the pixel, e.g. modification of the charge conversion ratio of the floating node capacitance): 1 patents
- H04N25/42 (by switching between different modes of operation using different resolutions or aspect ratios, e.g. switching between interlaced and non-interlaced mode): 1 patents
- H04N25/771 (comprising storage means other than floating diffusion): 1 patents
- H04N25/772 (comprising A/D, V/T, V/F, I/T or I/F converters): 1 patents
- H04N25/778 (comprising amplifiers shared between a plurality of pixels, i.e. at least one part of the amplifier must be on the sensor array itself): 1 patents
Companies
File:Kenji WATANABE Top Companies.png
List of Companies
- Nuvoton Technology Corporation Japan: 2 patents
Collaborators
- Jin MATSUMOTO (1 collaborations)
- Katsumi TOKUYAMA (1 collaborations)
- Mutsumi MATSUURA (1 collaborations)
- Makoto IKUMA (1 collaborations)
- Yutaka ABE (1 collaborations)
- Takayasu KITO (1 collaborations)
- Norihiko SUMITANI (1 collaborations)
Subcategories
This category has the following 11 subcategories, out of 11 total.