Category:Tasuku FUJIBE: Difference between revisions
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=== Executive Summary === | === Executive Summary === | ||
Tasuku FUJIBE is an inventor who has filed 4 patents. Their primary areas of innovation include | Tasuku FUJIBE is an inventor who has filed 4 patents. Their primary areas of innovation include Testing of electronic circuits, e.g. by signal tracer ({EMC, EMP or similar testing of electronic circuits (4 patents), Testing of electronic circuits, e.g. by signal tracer ({EMC, EMP or similar testing of electronic circuits (4 patents), Testing of electronic circuits, e.g. by signal tracer ({EMC, EMP or similar testing of electronic circuits (4 patents), and they have worked with companies such as ADVANTEST CORPORATION (4 patents). Their most frequent collaborators include [[Category:Hiroki ICHIKAWA|Hiroki ICHIKAWA]] (3 collaborations), [[Category:Satoshi SUDO|Satoshi SUDO]] (1 collaborations), [[Category:Takayuki TANAKA|Takayuki TANAKA]] (1 collaborations). | ||
=== Patent Filing Activity === | === Patent Filing Activity === | ||
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==== List of Technology Areas ==== | ==== List of Technology Areas ==== | ||
* [[:Category:CPC_G01R31/2887|G01R31/2887]] ( | * [[:Category:CPC_G01R31/2887|G01R31/2887]] (Testing of electronic circuits, e.g. by signal tracer ({EMC, EMP or similar testing of electronic circuits): 4 patents | ||
* [[:Category:CPC_G01R31/2893|G01R31/2893]] ( | * [[:Category:CPC_G01R31/2893|G01R31/2893]] (Testing of electronic circuits, e.g. by signal tracer ({EMC, EMP or similar testing of electronic circuits): 4 patents | ||
* [[:Category:CPC_G01R31/2889|G01R31/2889]] ( | * [[:Category:CPC_G01R31/2889|G01R31/2889]] (Testing of electronic circuits, e.g. by signal tracer ({EMC, EMP or similar testing of electronic circuits): 4 patents | ||
* [[:Category:CPC_G01R1/07328|G01R1/07328]] ( | * [[:Category:CPC_G01R1/07328|G01R1/07328]] (Multiple probes): 4 patents | ||
* [[:Category:CPC_G01R1/07357|G01R1/07357]] ( | * [[:Category:CPC_G01R1/07357|G01R1/07357]] ({with flexible bodies, e.g. buckling beams}): 4 patents | ||
=== Companies === | === Companies === | ||
Latest revision as of 15:54, 21 July 2024
Tasuku FUJIBE
Executive Summary
Tasuku FUJIBE is an inventor who has filed 4 patents. Their primary areas of innovation include Testing of electronic circuits, e.g. by signal tracer ({EMC, EMP or similar testing of electronic circuits (4 patents), Testing of electronic circuits, e.g. by signal tracer ({EMC, EMP or similar testing of electronic circuits (4 patents), Testing of electronic circuits, e.g. by signal tracer ({EMC, EMP or similar testing of electronic circuits (4 patents), and they have worked with companies such as ADVANTEST CORPORATION (4 patents). Their most frequent collaborators include (3 collaborations), (1 collaborations), (1 collaborations).
Patent Filing Activity
File:Tasuku FUJIBE Monthly Patent Applications.png
Technology Areas
File:Tasuku FUJIBE Top Technology Areas.png
List of Technology Areas
- G01R31/2887 (Testing of electronic circuits, e.g. by signal tracer ({EMC, EMP or similar testing of electronic circuits): 4 patents
- G01R31/2893 (Testing of electronic circuits, e.g. by signal tracer ({EMC, EMP or similar testing of electronic circuits): 4 patents
- G01R31/2889 (Testing of electronic circuits, e.g. by signal tracer ({EMC, EMP or similar testing of electronic circuits): 4 patents
- G01R1/07328 (Multiple probes): 4 patents
- G01R1/07357 ({with flexible bodies, e.g. buckling beams}): 4 patents
Companies
File:Tasuku FUJIBE Top Companies.png
List of Companies
- ADVANTEST CORPORATION: 4 patents
Collaborators
- Hiroki ICHIKAWA (3 collaborations)
- Satoshi SUDO (1 collaborations)
- Takayuki TANAKA (1 collaborations)
Subcategories
This category has the following 2 subcategories, out of 2 total.