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Category:Jian ZHANG: Difference between revisions - WikiTrademarks Jump to content

Category:Jian ZHANG: Difference between revisions

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=== Executive Summary ===
=== Executive Summary ===
Jian ZHANG is an inventor who has filed 2 patents. Their primary areas of innovation include OFFENSIVE OR DEFENSIVE ARRANGEMENTS ON VESSELS; MINE-LAYING; MINE-SWEEPING; SUBMARINES; AIRCRAFT CARRIERS  (means of attack or defence in general, e.g. turrets (1 patents), Mechanical parametric or variational design (1 patents), Apparatus therefor, e.g. for applying  ( (1 patents), and they have worked with companies such as JIANGSU UNIVERSITY OF SCIENCE AND TECHNOLOGY (2 patents). Their most frequent collaborators include [[Category:Xiaobin LIU|Xiaobin LIU]] (1 collaborations), [[Category:Chenyang DI|Chenyang DI]] (1 collaborations), [[Category:Ming ZHAN|Ming ZHAN]] (1 collaborations).
Jian ZHANG is an inventor who has filed 1 patents. Their primary areas of innovation include Stabilisation of spectrometers (1 patents), MEASUREMENT OF NUCLEAR OR X-RADIATION  (radiation analysis of materials, mass spectrometry (1 patents), and they have worked with companies such as National Institute of Metrology, China (1 patents). Their most frequent collaborators include [[Category:Jianwei HUANG|Jianwei HUANG]] (1 collaborations), [[Category:Dehong LI|Dehong LI]] (1 collaborations), [[Category:Lei CAO|Lei CAO]] (1 collaborations).


=== Patent Filing Activity ===
=== Patent Filing Activity ===
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==== List of Technology Areas ====
==== List of Technology Areas ====
* [[:Category:CPC_B63G8/04|B63G8/04]] (OFFENSIVE OR DEFENSIVE ARRANGEMENTS ON VESSELS; MINE-LAYING; MINE-SWEEPING; SUBMARINES; AIRCRAFT CARRIERS  (means of attack or defence in general, e.g. turrets): 1 patents
* [[:Category:CPC_G01T1/40|G01T1/40]] (Stabilisation of spectrometers): 1 patents
* [[:Category:CPC_G06F30/17|G06F30/17]] (Mechanical parametric or variational design): 1 patents
* [[:Category:CPC_G01T1/023|G01T1/023]] (MEASUREMENT OF NUCLEAR OR X-RADIATION  (radiation analysis of materials, mass spectrometry): 1 patents
* [[:Category:CPC_B29C73/12|B29C73/12]] (Apparatus therefor, e.g. for applying  (): 1 patents


=== Companies ===
=== Companies ===
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==== List of Companies ====
==== List of Companies ====
* JIANGSU UNIVERSITY OF SCIENCE AND TECHNOLOGY: 2 patents
* National Institute of Metrology, China: 1 patents


=== Collaborators ===
=== Collaborators ===
* [[:Category:Xiaobin LIU|Xiaobin LIU]][[Category:Xiaobin LIU]] (1 collaborations)
* [[:Category:Jianwei HUANG|Jianwei HUANG]][[Category:Jianwei HUANG]] (1 collaborations)
* [[:Category:Chenyang DI|Chenyang DI]][[Category:Chenyang DI]] (1 collaborations)
* [[:Category:Dehong LI|Dehong LI]][[Category:Dehong LI]] (1 collaborations)
* [[:Category:Ming ZHAN|Ming ZHAN]][[Category:Ming ZHAN]] (1 collaborations)
* [[:Category:Lei CAO|Lei CAO]][[Category:Lei CAO]] (1 collaborations)
* [[:Category:Yongsheng LI|Yongsheng LI]][[Category:Yongsheng LI]] (1 collaborations)
* [[:Category:Xuan ZHANG|Xuan ZHANG]][[Category:Xuan ZHANG]] (1 collaborations)
* [[:Category:Tan ZHAO|Tan ZHAO]][[Category:Tan ZHAO]] (1 collaborations)
* [[:Category:Xiaole ZHANG|Xiaole ZHANG]][[Category:Xiaole ZHANG]] (1 collaborations)
* [[:Category:Fang WANG|Fang WANG]][[Category:Fang WANG]] (1 collaborations)
* [[:Category:Yaofeng ZHANG|Yaofeng ZHANG]][[Category:Yaofeng ZHANG]] (1 collaborations)
* [[:Category:Wenxian TANG|Wenxian TANG]][[Category:Wenxian TANG]] (1 collaborations)
* [[:Category:Chuanfeng LIU|Chuanfeng LIU]][[Category:Chuanfeng LIU]] (1 collaborations)
* [[:Category:Yongmei ZHU|Yongmei ZHU]][[Category:Yongmei ZHU]] (1 collaborations)
* [[:Category:Zhan LIU|Zhan LIU]][[Category:Zhan LIU]] (1 collaborations)
* [[:Category:Hongzhang PAN|Hongzhang PAN]][[Category:Hongzhang PAN]] (1 collaborations)
* [[:Category:Yang YANG|Yang YANG]][[Category:Yang YANG]] (1 collaborations)
* [[:Category:Shijie SU|Shijie SU]][[Category:Shijie SU]] (1 collaborations)
* [[:Category:Suzhou ZHANG|Suzhou ZHANG]][[Category:Suzhou ZHANG]] (1 collaborations)
* [[:Category:Chuxiang LIN|Chuxiang LIN]][[Category:Chuxiang LIN]] (1 collaborations)


[[Category:Jian ZHANG]]
[[Category:Jian ZHANG]]
[[Category:Inventors]]
[[Category:Inventors]]
[[Category:Inventors filing patents with JIANGSU UNIVERSITY OF SCIENCE AND TECHNOLOGY]]
[[Category:Inventors filing patents with National Institute of Metrology, China]]

Revision as of 04:32, 24 March 2025

Jian ZHANG

Executive Summary

Jian ZHANG is an inventor who has filed 1 patents. Their primary areas of innovation include Stabilisation of spectrometers (1 patents), MEASUREMENT OF NUCLEAR OR X-RADIATION (radiation analysis of materials, mass spectrometry (1 patents), and they have worked with companies such as National Institute of Metrology, China (1 patents). Their most frequent collaborators include (1 collaborations), (1 collaborations), (1 collaborations).

Patent Filing Activity

File:Jian ZHANG Monthly Patent Applications.png

Technology Areas

File:Jian ZHANG Top Technology Areas.png

List of Technology Areas

  • G01T1/40 (Stabilisation of spectrometers): 1 patents
  • G01T1/023 (MEASUREMENT OF NUCLEAR OR X-RADIATION (radiation analysis of materials, mass spectrometry): 1 patents

Companies

File:Jian ZHANG Top Companies.png

List of Companies

  • National Institute of Metrology, China: 1 patents

Collaborators

Subcategories

This category has the following 19 subcategories, out of 19 total.

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L

M

P

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