Category:Ankur BAL: Difference between revisions

Latest revision as of 07:47, 24 March 2025

Ankur BAL

Executive Summary

Ankur BAL is an inventor who has filed 2 patents. Their primary areas of innovation include MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits (1 patents), MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits (1 patents), MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits (1 patents), and they have worked with companies such as STMICROELECTRONICS INTERNATIONAL N.V. (1 patents), STMicroelectronics International N.V. (1 patents). Their most frequent collaborators include (1 collaborations), (1 collaborations).

Patent Filing Activity

File:Ankur BAL Monthly Patent Applications.png

Technology Areas

File:Ankur BAL Top Technology Areas.png

List of Technology Areas

G01R31/318541 (MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits): 1 patents
G01R31/318536 (MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits): 1 patents
G01R31/31858 (MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits): 1 patents
G06F11/3419 (Recording or statistical evaluation of computer activity, e.g. of down time, of input/output operation {; Recording or statistical evaluation of user activity, e.g. usability assessment}): 1 patents
G01R31/2837 (Testing of electronic circuits, e.g. by signal tracer ({EMC, EMP or similar testing of electronic circuits): 1 patents
G01R31/2843 (Testing of electronic circuits, e.g. by signal tracer ({EMC, EMP or similar testing of electronic circuits): 1 patents
G06F11/3024 (Monitoring): 1 patents

Companies

File:Ankur BAL Top Companies.png

List of Companies

STMICROELECTRONICS INTERNATIONAL N.V.: 1 patents
STMicroelectronics International N.V.: 1 patents

Collaborators

Aradhana KUMARI (1 collaborations)
Sharad GUPTA (1 collaborations)

Subcategories

This category has only the following subcategory.

A

► Ankur BAL‎ (1 C)

@@ Line 2: / Line 2: @@
 === Executive Summary ===
-Ankur BAL is an inventor who has filed 6 patents. Their primary areas of innovation include No explanation available (1 patents), No explanation available (1 patents), No explanation available (1 patents), and they have worked with companies such as STMicroelectronics International N.V. (6 patents). Their most frequent collaborators include [[Category:Vikram SINGH|Vikram SINGH]] (2 collaborations), [[Category:Abhishek JAIN|Abhishek JAIN]] (1 collaborations), [[Category:Sharad GUPTA|Sharad GUPTA]] (1 collaborations).
+Ankur BAL is an inventor who has filed 2 patents. Their primary areas of innovation include MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES  (indicating correct tuning of resonant circuits (1 patents), MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES  (indicating correct tuning of resonant circuits (1 patents), MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES  (indicating correct tuning of resonant circuits (1 patents), and they have worked with companies such as STMICROELECTRONICS INTERNATIONAL N.V. (1 patents), STMicroelectronics International N.V. (1 patents). Their most frequent collaborators include [[Category:Aradhana KUMARI|Aradhana KUMARI]] (1 collaborations), [[Category:Sharad GUPTA|Sharad GUPTA]] (1 collaborations).
 === Patent Filing Activity ===
@@ Line 11: / Line 11: @@
 ==== List of Technology Areas ====
-* [[:Category:CPC_H03M3/378|H03M3/378]] (No explanation available): 1 patents
+* [[:Category:CPC_G01R31/318541|G01R31/318541]] (MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES  (indicating correct tuning of resonant circuits): 1 patents
-* [[:Category:CPC_H03M3/46|H03M3/46]] (No explanation available): 1 patents
+* [[:Category:CPC_G01R31/318536|G01R31/318536]] (MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES  (indicating correct tuning of resonant circuits): 1 patents
-* [[:Category:CPC_H03M3/496|H03M3/496]] (No explanation available): 1 patents
+* [[:Category:CPC_G01R31/31858|G01R31/31858]] (MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES  (indicating correct tuning of resonant circuits): 1 patents
-* [[:Category:CPC_H03M1/1028|H03M1/1028]] (No explanation available): 1 patents
+* [[:Category:CPC_G06F11/3419|G06F11/3419]] (Recording or statistical evaluation of computer activity, e.g. of down time, of input/output operation {; Recording or statistical evaluation of user activity, e.g. usability assessment}): 1 patents
-* [[:Category:CPC_H03M1/1038|H03M1/1038]] (No explanation available): 1 patents
+* [[:Category:CPC_G01R31/2837|G01R31/2837]] (Testing of electronic circuits, e.g. by signal tracer  ({EMC, EMP or similar testing of electronic circuits): 1 patents
-* [[:Category:CPC_H03M1/0626|H03M1/0626]] (No explanation available): 1 patents
+* [[:Category:CPC_G01R31/2843|G01R31/2843]] (Testing of electronic circuits, e.g. by signal tracer  ({EMC, EMP or similar testing of electronic circuits): 1 patents
-* [[:Category:CPC_H03M1/1255|H03M1/1255]] (No explanation available): 1 patents
+* [[:Category:CPC_G06F11/3024|G06F11/3024]] (Monitoring): 1 patents
-* [[:Category:CPC_H03M1/1071|H03M1/1071]] (No explanation available): 1 patents
-* [[:Category:CPC_H03L7/195|H03L7/195]] (No explanation available): 1 patents
-* [[:Category:CPC_H03L7/199|H03L7/199]] (No explanation available): 1 patents
-* [[:Category:CPC_H03K3/356026|H03K3/356026]] (No explanation available): 1 patents
-* [[:Category:CPC_G01S7/35|G01S7/35]] (No explanation available): 1 patents
-* [[:Category:CPC_H03M3/458|H03M3/458]] (No explanation available): 1 patents
-* [[:Category:CPC_H03H21/0012|H03H21/0012]] (No explanation available): 1 patents
 === Companies ===
@@ Line 30: / Line 23: @@
 ==== List of Companies ====
-* STMicroelectronics International N.V.: 6 patents
+* STMICROELECTRONICS INTERNATIONAL N.V.: 1 patents
+* STMicroelectronics International N.V.: 1 patents
 === Collaborators ===
-* [[:Category:Vikram SINGH|Vikram SINGH]][[Category:Vikram SINGH]] (2 collaborations)
+* [[:Category:Aradhana KUMARI|Aradhana KUMARI]][[Category:Aradhana KUMARI]] (1 collaborations)
-* [[:Category:Abhishek JAIN|Abhishek JAIN]][[Category:Abhishek JAIN]] (1 collaborations)
 * [[:Category:Sharad GUPTA|Sharad GUPTA]][[Category:Sharad GUPTA]] (1 collaborations)
-* [[:Category:Anubhuti CHOPRA|Anubhuti CHOPRA]][[Category:Anubhuti CHOPRA]] (1 collaborations)
-* [[:Category:Jeet Narayan TIWARI|Jeet Narayan TIWARI]][[Category:Jeet Narayan TIWARI]] (1 collaborations)
-* [[:Category:Rupesh SINGH|Rupesh SINGH]][[Category:Rupesh SINGH]] (1 collaborations)
 [[Category:Ankur BAL]]
 [[Category:Inventors]]
+[[Category:Inventors filing patents with STMICROELECTRONICS INTERNATIONAL N.V.]]
 [[Category:Inventors filing patents with STMicroelectronics International N.V.]]