Category:Hiraku HIRABAYASHI: Difference between revisions

Latest revision as of 03:01, 31 March 2025

Hiraku HIRABAYASHI

Executive Summary

Hiraku HIRABAYASHI is an inventor who has filed 4 patents. Their primary areas of innovation include {using multilayer structures, e.g. giant magnetoresistance sensors (thin magnetic films (2 patents), Circuit arrangements for detecting position (1 patents), MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS (1 patents), and they have worked with companies such as TDK CORPORATION (2 patents), TDK Corporation (2 patents). Their most frequent collaborators include (3 collaborations), (1 collaborations), (1 collaborations).

Patent Filing Activity

File:Hiraku HIRABAYASHI Monthly Patent Applications.png

Technology Areas

File:Hiraku HIRABAYASHI Top Technology Areas.png

List of Technology Areas

G01R33/093 ({using multilayer structures, e.g. giant magnetoresistance sensors (thin magnetic films): 2 patents
H02P6/16 (Circuit arrangements for detecting position): 1 patents
G01B7/30 (MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS): 1 patents
G01D5/16 (MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR): 1 patents
H02K29/08 (using magnetic effect devices, e.g. Hall-plates, magneto-resistors (): 1 patents
G01R33/09 (Magnetoresistive devices): 1 patents
G01R15/148 (Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks): 1 patents
H10N50/80 (No explanation available): 1 patents
G01R33/0029 (Arrangements or instruments for measuring magnetic variables): 1 patents
G01R33/098 ({comprising tunnel junctions, e.g. tunnel magnetoresistance sensors}): 1 patents

Companies

File:Hiraku HIRABAYASHI Top Companies.png

List of Companies

TDK CORPORATION: 2 patents
TDK Corporation: 2 patents

Collaborators

Kazuya WATANABE (3 collaborations)
Shunji SARUKI (1 collaborations)
Keisuke TAKASUGI (1 collaborations)
Kenzo MAKINO (1 collaborations)
Masanori SAKAI (1 collaborations)
Norikazu OTA (1 collaborations)
Shinichirou MOCHIZUKI (1 collaborations)

Subcategories

This category has the following 4 subcategories, out of 4 total.

H

► Hiraku HIRABAYASHI‎ (4 C)

K

► Kazuya WATANABE‎ (3 C)
► Keisuke UCHIDA‎ (2 C)
► Kenzo MAKINO‎ (2 C)

@@ Line 2: / Line 2: @@
 === Executive Summary ===
-Hiraku HIRABAYASHI is an inventor who has filed 8 patents. Their primary areas of innovation include {using multilayer structures, e.g. giant magnetoresistance sensors  (thin magnetic films (4 patents), {comprising tunnel junctions, e.g. tunnel magnetoresistance sensors} (3 patents), {Constructional adaptation of the sensor to specific applications} (3 patents), and they have worked with companies such as TDK CORPORATION (7 patents), TDK Corporation (1 patents). Their most frequent collaborators include [[Category:Norikazu OTA|Norikazu OTA]] (4 collaborations), [[Category:Kazuya WATANABE|Kazuya WATANABE]] (3 collaborations), [[Category:Kazuma YAMAWAKI|Kazuma YAMAWAKI]] (2 collaborations).
+Hiraku HIRABAYASHI is an inventor who has filed 4 patents. Their primary areas of innovation include {using multilayer structures, e.g. giant magnetoresistance sensors  (thin magnetic films (2 patents), Circuit arrangements for detecting position (1 patents), MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS (1 patents), and they have worked with companies such as TDK CORPORATION (2 patents), TDK Corporation (2 patents). Their most frequent collaborators include [[Category:Kazuya WATANABE|Kazuya WATANABE]] (3 collaborations), [[Category:Shunji SARUKI|Shunji SARUKI]] (1 collaborations), [[Category:Keisuke TAKASUGI|Keisuke TAKASUGI]] (1 collaborations).
 === Patent Filing Activity ===
@@ Line 11: / Line 11: @@
 ==== List of Technology Areas ====
-* [[:Category:CPC_G01R33/093|G01R33/093]] ({using multilayer structures, e.g. giant magnetoresistance sensors  (thin magnetic films): 4 patents
+* [[:Category:CPC_G01R33/093|G01R33/093]] ({using multilayer structures, e.g. giant magnetoresistance sensors  (thin magnetic films): 2 patents
-* [[:Category:CPC_G01R33/098|G01R33/098]] ({comprising tunnel junctions, e.g. tunnel magnetoresistance sensors}): 3 patents
+* [[:Category:CPC_H02P6/16|H02P6/16]] (Circuit arrangements for detecting position): 1 patents
-* [[:Category:CPC_G01R33/091|G01R33/091]] ({Constructional adaptation of the sensor to specific applications}): 3 patents
+* [[:Category:CPC_G01B7/30|G01B7/30]] (MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS): 1 patents
-* [[:Category:CPC_G01R15/205|G01R15/205]] (using galvano-magnetic devices, e.g. Hall-effect devices {, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices}): 3 patents
+* [[:Category:CPC_G01D5/16|G01D5/16]] (MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR): 1 patents
-* [[:Category:CPC_G01R33/09|G01R33/09]] (Magnetoresistive devices): 2 patents
+* [[:Category:CPC_H02K29/08|H02K29/08]] (using magnetic effect devices, e.g. Hall-plates, magneto-resistors  (): 1 patents
-* [[:Category:CPC_G01R19/0092|G01R19/0092]] (Arrangements for measuring currents or voltages or for indicating presence or sign thereof  (): 2 patents
+* [[:Category:CPC_G01R33/09|G01R33/09]] (Magnetoresistive devices): 1 patents
-* [[:Category:CPC_G01R33/0206|G01R33/0206]] ({Three-component magnetometers}): 2 patents
+* [[:Category:CPC_G01R15/148|G01R15/148]] (Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks): 1 patents
-* [[:Category:CPC_G01R33/0005|G01R33/0005]] (Arrangements or instruments for measuring magnetic variables): 2 patents
-* [[:Category:CPC_H10N50/01|H10N50/01]] (No explanation available): 1 patents
-* [[:Category:CPC_H10N50/10|H10N50/10]] (No explanation available): 1 patents
 * [[:Category:CPC_H10N50/80|H10N50/80]] (No explanation available): 1 patents
-* [[:Category:CPC_G01D5/16|G01D5/16]] (MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR): 1 patents
+* [[:Category:CPC_G01R33/0029|G01R33/0029]] (Arrangements or instruments for measuring magnetic variables): 1 patents
-* [[:Category:CPC_G01D5/145|G01D5/145]] (MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR): 1 patents
+* [[:Category:CPC_G01R33/098|G01R33/098]] ({comprising tunnel junctions, e.g. tunnel magnetoresistance sensors}): 1 patents
-* [[:Category:CPC_G02B7/00|G02B7/00]] (Mountings, adjusting means, or light-tight connections, for optical elements): 1 patents
-* [[:Category:CPC_G03B3/00|G03B3/00]] (Focusing arrangements of general interest for cameras, projectors or printers): 1 patents
-* [[:Category:CPC_G03B5/00|G03B5/00]] (APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR  (optical parts of such apparatus): 1 patents
-* [[:Category:CPC_H01C7/00|H01C7/00]] (Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material  (consisting of loose powdered or granular material): 1 patents
-* [[:Category:CPC_H01F7/064|H01F7/064]] (MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES  (ceramics based on ferrites): 1 patents
-* [[:Category:CPC_H01F27/28|H01F27/28]] (MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES  (ceramics based on ferrites): 1 patents
-* [[:Category:CPC_B82Y10/00|B82Y10/00]] (Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic): 1 patents
-* [[:Category:CPC_B82Y25/00|B82Y25/00]] (Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance): 1 patents
-* [[:Category:CPC_B82Y40/00|B82Y40/00]] (Manufacture or treatment of nanostructures): 1 patents
-* [[:Category:CPC_G01R33/0094|G01R33/0094]] (Arrangements or instruments for measuring magnetic variables): 1 patents
-* [[:Category:CPC_G01R33/096|G01R33/096]] (Magnetoresistive devices): 1 patents
-* [[:Category:CPC_G01R33/0082|G01R33/0082]] (Arrangements or instruments for measuring magnetic variables): 1 patents
-* [[:Category:CPC_G01R33/07|G01R33/07]] (MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES  (indicating correct tuning of resonant circuits): 1 patents
 === Companies ===
@@ Line 42: / Line 26: @@
 ==== List of Companies ====
-* TDK CORPORATION: 7 patents
+* TDK CORPORATION: 2 patents
-* TDK Corporation: 1 patents
+* TDK Corporation: 2 patents
 === Collaborators ===
-* [[:Category:Norikazu OTA|Norikazu OTA]][[Category:Norikazu OTA]] (4 collaborations)
 * [[:Category:Kazuya WATANABE|Kazuya WATANABE]][[Category:Kazuya WATANABE]] (3 collaborations)
-* [[:Category:Kazuma YAMAWAKI|Kazuma YAMAWAKI]][[Category:Kazuma YAMAWAKI]] (2 collaborations)
+* [[:Category:Shunji SARUKI|Shunji SARUKI]][[Category:Shunji SARUKI]] (1 collaborations)
-* [[:Category:Tsuyoshi UMEHARA|Tsuyoshi UMEHARA]][[Category:Tsuyoshi UMEHARA]] (2 collaborations)
+* [[:Category:Keisuke TAKASUGI|Keisuke TAKASUGI]][[Category:Keisuke TAKASUGI]] (1 collaborations)
-* [[:Category:Keisuke UCHIDA|Keisuke UCHIDA]][[Category:Keisuke UCHIDA]] (2 collaborations)
-* [[:Category:Yuta SAITO|Yuta SAITO]][[Category:Yuta SAITO]] (1 collaborations)
-* [[:Category:Yoshihiro KUDO|Yoshihiro KUDO]][[Category:Yoshihiro KUDO]] (1 collaborations)
-* [[:Category:Takehiro ISODA|Takehiro ISODA]][[Category:Takehiro ISODA]] (1 collaborations)
-* [[:Category:Shuhei MIYAZAKI|Shuhei MIYAZAKI]][[Category:Shuhei MIYAZAKI]] (1 collaborations)
-* [[:Category:Hayato MIYASHITA|Hayato MIYASHITA]][[Category:Hayato MIYASHITA]] (1 collaborations)
 * [[:Category:Kenzo MAKINO|Kenzo MAKINO]][[Category:Kenzo MAKINO]] (1 collaborations)
-* [[:Category:Kunihiro UEDA|Kunihiro UEDA]][[Category:Kunihiro UEDA]] (1 collaborations)
+* [[:Category:Masanori SAKAI|Masanori SAKAI]][[Category:Masanori SAKAI]] (1 collaborations)
-* [[:Category:Yoshimitsu WADA|Yoshimitsu WADA]][[Category:Yoshimitsu WADA]] (1 collaborations)
+* [[:Category:Norikazu OTA|Norikazu OTA]][[Category:Norikazu OTA]] (1 collaborations)
-* [[:Category:Masaki NAGATA|Masaki NAGATA]][[Category:Masaki NAGATA]] (1 collaborations)
+* [[:Category:Shinichirou MOCHIZUKI|Shinichirou MOCHIZUKI]][[Category:Shinichirou MOCHIZUKI]] (1 collaborations)
-* [[:Category:Kohei HONMA|Kohei HONMA]][[Category:Kohei HONMA]] (1 collaborations)
 [[Category:Hiraku HIRABAYASHI]]
 [[Category:Inventors]]
+[[Category:Inventors filing patents with TDK CORPORATION]]
 [[Category:Inventors filing patents with TDK Corporation]]
-[[Category:Inventors filing patents with TDK CORPORATION]]