Category:Jian ZHANG

Jian ZHANG

Executive Summary

Jian ZHANG is an inventor who has filed 1 patents. Their primary areas of innovation include Stabilisation of spectrometers (1 patents), MEASUREMENT OF NUCLEAR OR X-RADIATION (radiation analysis of materials, mass spectrometry (1 patents), and they have worked with companies such as National Institute of Metrology, China (1 patents). Their most frequent collaborators include (1 collaborations), (1 collaborations), (1 collaborations).

Patent Filing Activity

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Technology Areas

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List of Technology Areas

• G01T1/40 (Stabilisation of spectrometers): 1 patents
• G01T1/023 (MEASUREMENT OF NUCLEAR OR X-RADIATION (radiation analysis of materials, mass spectrometry): 1 patents

Companies

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List of Companies

• National Institute of Metrology, China: 1 patents

Collaborators

• Jianwei HUANG (1 collaborations)
• Dehong LI (1 collaborations)
• Lei CAO (1 collaborations)
• Xuan ZHANG (1 collaborations)
• Xiaole ZHANG (1 collaborations)
• Yaofeng ZHANG (1 collaborations)
• Chuanfeng LIU (1 collaborations)
• Zhan LIU (1 collaborations)
• Yang YANG (1 collaborations)