Category:Hiraku HIRABAYASHI

Hiraku HIRABAYASHI

Executive Summary

Hiraku HIRABAYASHI is an inventor who has filed 8 patents. Their primary areas of innovation include {using multilayer structures, e.g. giant magnetoresistance sensors (thin magnetic films (4 patents), {comprising tunnel junctions, e.g. tunnel magnetoresistance sensors} (3 patents), {Constructional adaptation of the sensor to specific applications} (3 patents), and they have worked with companies such as TDK CORPORATION (7 patents), TDK Corporation (1 patents). Their most frequent collaborators include (4 collaborations), (3 collaborations), (2 collaborations).

Patent Filing Activity

File:Hiraku HIRABAYASHI Monthly Patent Applications.png

Technology Areas

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List of Technology Areas

• G01R33/093 ({using multilayer structures, e.g. giant magnetoresistance sensors (thin magnetic films): 4 patents
• G01R33/098 ({comprising tunnel junctions, e.g. tunnel magnetoresistance sensors}): 3 patents
• G01R33/091 ({Constructional adaptation of the sensor to specific applications}): 3 patents
• G01R15/205 (using galvano-magnetic devices, e.g. Hall-effect devices {, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices}): 3 patents
• G01R33/09 (Magnetoresistive devices): 2 patents
• G01R19/0092 (Arrangements for measuring currents or voltages or for indicating presence or sign thereof (): 2 patents
• G01R33/0206 ({Three-component magnetometers}): 2 patents
• G01R33/0005 (Arrangements or instruments for measuring magnetic variables): 2 patents
• H10N50/01 (No explanation available): 1 patents
• H10N50/10 (No explanation available): 1 patents
• H10N50/80 (No explanation available): 1 patents
• G01D5/16 (MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR): 1 patents
• G01D5/145 (MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR): 1 patents
• G02B7/00 (Mountings, adjusting means, or light-tight connections, for optical elements): 1 patents
• G03B3/00 (Focusing arrangements of general interest for cameras, projectors or printers): 1 patents
• G03B5/00 (APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR (optical parts of such apparatus): 1 patents
• H01C7/00 (Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material (consisting of loose powdered or granular material): 1 patents
• H01F7/064 (MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES (ceramics based on ferrites): 1 patents
• H01F27/28 (MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES (ceramics based on ferrites): 1 patents
• B82Y10/00 (Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic): 1 patents
• B82Y25/00 (Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance): 1 patents
• B82Y40/00 (Manufacture or treatment of nanostructures): 1 patents
• G01R33/0094 (Arrangements or instruments for measuring magnetic variables): 1 patents
• G01R33/096 (Magnetoresistive devices): 1 patents
• G01R33/0082 (Arrangements or instruments for measuring magnetic variables): 1 patents
• G01R33/07 (MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits): 1 patents

Companies

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List of Companies

• TDK CORPORATION: 7 patents
• TDK Corporation: 1 patents

Collaborators

• Norikazu OTA (4 collaborations)
• Kazuya WATANABE (3 collaborations)
• Kazuma YAMAWAKI (2 collaborations)
• Tsuyoshi UMEHARA (2 collaborations)
• Keisuke UCHIDA (2 collaborations)
• Yuta SAITO (1 collaborations)
• Yoshihiro KUDO (1 collaborations)
• Takehiro ISODA (1 collaborations)
• Shuhei MIYAZAKI (1 collaborations)
• Hayato MIYASHITA (1 collaborations)
• Kenzo MAKINO (1 collaborations)
• Kunihiro UEDA (1 collaborations)
• Yoshimitsu WADA (1 collaborations)
• Masaki NAGATA (1 collaborations)
• Kohei HONMA (1 collaborations)