Category:Kenji WATANABE

Kenji WATANABE

Executive Summary

Kenji WATANABE is an inventor who has filed 2 patents. Their primary areas of innovation include {Inspection of images, e.g. flaw detection} (1 patents), Topological mapping of higher dimensional structures onto lower dimensional surfaces (1 patents), using local operators (1 patents), and they have worked with companies such as Nuvoton Technology Corporation Japan (2 patents). Their most frequent collaborators include (1 collaborations), (1 collaborations), (1 collaborations).

Patent Filing Activity

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Technology Areas

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List of Technology Areas

• G06T7/0002 ({Inspection of images, e.g. flaw detection}): 1 patents
• G06T3/06 (Topological mapping of higher dimensional structures onto lower dimensional surfaces): 1 patents
• G06T5/20 (using local operators): 1 patents
• G06T11/60 (Editing figures and text; Combining figures or text): 1 patents
• H04N25/59 (by controlling the amount of charge storable in the pixel, e.g. modification of the charge conversion ratio of the floating node capacitance): 1 patents
• H04N25/42 (by switching between different modes of operation using different resolutions or aspect ratios, e.g. switching between interlaced and non-interlaced mode): 1 patents
• H04N25/771 (comprising storage means other than floating diffusion): 1 patents
• H04N25/772 (comprising A/D, V/T, V/F, I/T or I/F converters): 1 patents
• H04N25/778 (comprising amplifiers shared between a plurality of pixels, i.e. at least one part of the amplifier must be on the sensor array itself): 1 patents

Companies

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List of Companies

• Nuvoton Technology Corporation Japan: 2 patents

Collaborators

• Jin MATSUMOTO (1 collaborations)
• Katsumi TOKUYAMA (1 collaborations)
• Mutsumi MATSUURA (1 collaborations)
• Makoto IKUMA (1 collaborations)
• Yutaka ABE (1 collaborations)
• Takayasu KITO (1 collaborations)
• Norihiko SUMITANI (1 collaborations)