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Category:Priscilla Tze-Wei GOH

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Priscilla Tze-Wei GOH

Executive Summary

Priscilla Tze-Wei GOH is an inventor who has filed 2 patents. Their primary areas of innovation include MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS (2 patents), MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR (2 patents), and they have worked with companies such as PIXART IMAGING INC. (2 patents). Their most frequent collaborators include (2 collaborations), (2 collaborations), (2 collaborations).

Patent Filing Activity

File:Priscilla Tze-Wei GOH Monthly Patent Applications.png

Technology Areas

File:Priscilla Tze-Wei GOH Top Technology Areas.png

List of Technology Areas

  • G01B11/26 (MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS): 2 patents
  • G01D5/264 (MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR): 2 patents

Companies

File:Priscilla Tze-Wei GOH Top Companies.png

List of Companies

  • PIXART IMAGING INC.: 2 patents

Collaborators

Subcategories

This category has the following 4 subcategories, out of 4 total.

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