Category:Priscilla Tze-Wei GOH
Priscilla Tze-Wei GOH
Executive Summary
Priscilla Tze-Wei GOH is an inventor who has filed 2 patents. Their primary areas of innovation include MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS (2 patents), MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR (2 patents), and they have worked with companies such as PIXART IMAGING INC. (2 patents). Their most frequent collaborators include (2 collaborations), (2 collaborations), (2 collaborations).
Patent Filing Activity
File:Priscilla Tze-Wei GOH Monthly Patent Applications.png
Technology Areas
File:Priscilla Tze-Wei GOH Top Technology Areas.png
List of Technology Areas
- G01B11/26 (MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS): 2 patents
- G01D5/264 (MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR): 2 patents
Companies
File:Priscilla Tze-Wei GOH Top Companies.png
List of Companies
- PIXART IMAGING INC.: 2 patents
Collaborators
- Meng-Yee LIM (2 collaborations)
- Kuan-Choong SHIM (2 collaborations)
- Gim-Eng CHEW (2 collaborations)
Subcategories
This category has the following 4 subcategories, out of 4 total.