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Category:Maxim PISARENCO: Difference between revisions - WikiTrademarks Jump to content

Category:Maxim PISARENCO: Difference between revisions

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=== Executive Summary ===
=== Executive Summary ===
Maxim PISARENCO is an inventor who has filed 5 patents. Their primary areas of innovation include Image acquisition modality (2 patents), Special algorithmic details (2 patents), Subject of image; Context of image processing (2 patents), and they have worked with companies such as ASML Netherlands B.V. (3 patents), ASML NETHERLANDS B.V. (2 patents). Their most frequent collaborators include [[Category:Scott Anderson MIDDLEBROOKS|Scott Anderson MIDDLEBROOKS]] (4 collaborations), [[Category:Chrysostomos BATISTAKIS|Chrysostomos BATISTAKIS]] (3 collaborations), [[Category:Markus Gerardus Martinus Maria VAN KRAAIJ|Markus Gerardus Martinus Maria VAN KRAAIJ]] (2 collaborations).
Maxim PISARENCO is an inventor who has filed 2 patents. Their primary areas of innovation include INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES  (measuring or testing processes other than immunoassay, involving enzymes or microorganisms (1 patents), {using an image reference approach} (1 patents), INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES  (measuring or testing processes other than immunoassay, involving enzymes or microorganisms (1 patents), and they have worked with companies such as ASML Netherlands B.V. (2 patents). Their most frequent collaborators include [[Category:Tim HOUBEN|Tim HOUBEN]] (1 collaborations), [[Category:Thomas Jarik HUISMAN|Thomas Jarik HUISMAN]] (1 collaborations), [[Category:Lingling PU of San Jose CA (US)|Lingling PU of San Jose CA (US)]] (1 collaborations).


=== Patent Filing Activity ===
=== Patent Filing Activity ===
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==== List of Technology Areas ====
==== List of Technology Areas ====
* [[:Category:CPC_G06T2207/10061|G06T2207/10061]] (Image acquisition modality): 2 patents
* [[:Category:CPC_G01N23/2251|G01N23/2251]] (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES  (measuring or testing processes other than immunoassay, involving enzymes or microorganisms): 1 patents
* [[:Category:CPC_G06T2207/20081|G06T2207/20081]] (Special algorithmic details): 2 patents
* [[:Category:CPC_G06T7/001|G06T7/001]] ({using an image reference approach}): 1 patents
* [[:Category:CPC_G06T2207/30148|G06T2207/30148]] (Subject of image; Context of image processing): 2 patents
* [[:Category:CPC_G01N2223/401|G01N2223/401]] (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES  (measuring or testing processes other than immunoassay, involving enzymes or microorganisms): 1 patents
* [[:Category:CPC_G06V10/24|G06V10/24]] (IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING): 1 patents
* [[:Category:CPC_G06T2207/10061|G06T2207/10061]] (Image acquisition modality): 1 patents
* [[:Category:CPC_G06T11/00|G06T11/00]] (2D [Two Dimensional] image generation): 1 patents
* [[:Category:CPC_G06T2207/20081|G06T2207/20081]] (Special algorithmic details): 1 patents
* [[:Category:CPC_G06V10/82|G06V10/82]] (IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING): 1 patents
* [[:Category:CPC_G06V10/993|G06V10/993]] (IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING): 1 patents
* [[:Category:CPC_G06T7/593|G06T7/593]] (from stereo images): 1 patents
* [[:Category:CPC_G06T5/50|G06T5/50]] (using two or more images, e.g. averaging or subtraction): 1 patents
* [[:Category:CPC_G06T7/13|G06T7/13]] (Edge detection): 1 patents
* [[:Category:CPC_G06T2207/20084|G06T2207/20084]] (Special algorithmic details): 1 patents
* [[:Category:CPC_G06T2207/20084|G06T2207/20084]] (Special algorithmic details): 1 patents
* [[:Category:CPC_G06T2207/10012|G06T2207/10012]] (Image acquisition modality): 1 patents
* [[:Category:CPC_G06T2207/30148|G06T2207/30148]] (Subject of image; Context of image processing): 1 patents
* [[:Category:CPC_G06T2207/20212|G06T2207/20212]] (Special algorithmic details): 1 patents
* [[:Category:CPC_G06N20/00|G06N20/00]] (Machine learning): 1 patents
* [[:Category:CPC_G06T7/0004|G06T7/0004]] ({Industrial image inspection}): 1 patents
* [[:Category:CPC_G06T2207/20021|G06T2207/20021]] (Special algorithmic details): 1 patents
* [[:Category:CPC_G03F7/705|G03F7/705]] (PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR;  (phototypographic composing devices): 1 patents
* [[:Category:CPC_G03F7/70575|G03F7/70575]] (PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR;  (phototypographic composing devices): 1 patents
* [[:Category:CPC_G03F7/70675|G03F7/70675]] (PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR;  (phototypographic composing devices): 1 patents


=== Companies ===
=== Companies ===
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==== List of Companies ====
==== List of Companies ====
* ASML Netherlands B.V.: 3 patents
* ASML Netherlands B.V.: 2 patents
* ASML NETHERLANDS B.V.: 2 patents


=== Collaborators ===
=== Collaborators ===
* [[:Category:Scott Anderson MIDDLEBROOKS|Scott Anderson MIDDLEBROOKS]][[Category:Scott Anderson MIDDLEBROOKS]] (4 collaborations)
* [[:Category:Chrysostomos BATISTAKIS|Chrysostomos BATISTAKIS]][[Category:Chrysostomos BATISTAKIS]] (3 collaborations)
* [[:Category:Markus Gerardus Martinus Maria VAN KRAAIJ|Markus Gerardus Martinus Maria VAN KRAAIJ]][[Category:Markus Gerardus Martinus Maria VAN KRAAIJ]] (2 collaborations)
* [[:Category:Coen Adrianus VERSCHUREN|Coen Adrianus VERSCHUREN]][[Category:Coen Adrianus VERSCHUREN]] (1 collaborations)
* [[:Category:Tim HOUBEN|Tim HOUBEN]][[Category:Tim HOUBEN]] (1 collaborations)
* [[:Category:Tim HOUBEN|Tim HOUBEN]][[Category:Tim HOUBEN]] (1 collaborations)
* [[:Category:Thomas Jarik HUISMAN|Thomas Jarik HUISMAN]][[Category:Thomas Jarik HUISMAN]] (1 collaborations)
* [[:Category:Thomas Jarik HUISMAN|Thomas Jarik HUISMAN]][[Category:Thomas Jarik HUISMAN]] (1 collaborations)
* [[:Category:Yu CAO of Saratoga CA (US)|Yu CAO of Saratoga CA (US)]][[Category:Yu CAO of Saratoga CA (US)]] (1 collaborations)
* [[:Category:Lingling PU of San Jose CA (US)|Lingling PU of San Jose CA (US)]][[Category:Lingling PU of San Jose CA (US)]] (1 collaborations)
* [[:Category:Huina XU of Los Altos CA (US)|Huina XU of Los Altos CA (US)]][[Category:Huina XU of Los Altos CA (US)]] (1 collaborations)
* [[:Category:Jian ZHOU of San Jose CA (US)|Jian ZHOU of San Jose CA (US)]][[Category:Jian ZHOU of San Jose CA (US)]] (1 collaborations)
* [[:Category:Yana MATSUSHITA of Redwood City CA (US)|Yana MATSUSHITA of Redwood City CA (US)]][[Category:Yana MATSUSHITA of Redwood City CA (US)]] (1 collaborations)
* [[:Category:Liangjiang YU of Pleasanton CA (US)|Liangjiang YU of Pleasanton CA (US)]][[Category:Liangjiang YU of Pleasanton CA (US)]] (1 collaborations)
* [[:Category:Tanbir HASAN of San Jose CA (US)|Tanbir HASAN of San Jose CA (US)]][[Category:Tanbir HASAN of San Jose CA (US)]] (1 collaborations)
* [[:Category:Yi-Hsin CHANG of Milpitas CA (US)|Yi-Hsin CHANG of Milpitas CA (US)]][[Category:Yi-Hsin CHANG of Milpitas CA (US)]] (1 collaborations)
* [[:Category:Ren-Jay KOU of Cupertino CA (US)|Ren-Jay KOU of Cupertino CA (US)]][[Category:Ren-Jay KOU of Cupertino CA (US)]] (1 collaborations)
* [[:Category:Yun-Ling YEH of San Jose CA (US)|Yun-Ling YEH of San Jose CA (US)]][[Category:Yun-Ling YEH of San Jose CA (US)]] (1 collaborations)
* [[:Category:Namita Adrianus GOEL of San Jose CA (US)|Namita Adrianus GOEL of San Jose CA (US)]][[Category:Namita Adrianus GOEL of San Jose CA (US)]] (1 collaborations)
* [[:Category:Chrysostomos BATISTAKIS|Chrysostomos BATISTAKIS]][[Category:Chrysostomos BATISTAKIS]] (1 collaborations)
* [[:Category:Hongmei LI of San Jose CA (US)|Hongmei LI of San Jose CA (US)]][[Category:Hongmei LI of San Jose CA (US)]] (1 collaborations)
* [[:Category:Marleen KOOIMAN|Marleen KOOIMAN]][[Category:Marleen KOOIMAN]] (1 collaborations)
* [[:Category:Johannes ONVLEE|Johannes ONVLEE]][[Category:Johannes ONVLEE]] (1 collaborations)
* [[:Category:Patrick Philipp HELFENSTEIN|Patrick Philipp HELFENSTEIN]][[Category:Patrick Philipp HELFENSTEIN]] (1 collaborations)
* [[:Category:Alexander Prasetya KONIJNENBERG|Alexander Prasetya KONIJNENBERG]][[Category:Alexander Prasetya KONIJNENBERG]] (1 collaborations)


[[Category:Maxim PISARENCO]]
[[Category:Maxim PISARENCO]]
[[Category:Inventors]]
[[Category:Inventors]]
[[Category:Inventors filing patents with ASML Netherlands B.V.]]
[[Category:Inventors filing patents with ASML Netherlands B.V.]]
[[Category:Inventors filing patents with ASML NETHERLANDS B.V.]]

Latest revision as of 05:01, 30 March 2025

Maxim PISARENCO

Executive Summary

Maxim PISARENCO is an inventor who has filed 2 patents. Their primary areas of innovation include INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms (1 patents), {using an image reference approach} (1 patents), INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms (1 patents), and they have worked with companies such as ASML Netherlands B.V. (2 patents). Their most frequent collaborators include (1 collaborations), (1 collaborations), (1 collaborations).

Patent Filing Activity

File:Maxim PISARENCO Monthly Patent Applications.png

Technology Areas

File:Maxim PISARENCO Top Technology Areas.png

List of Technology Areas

  • G01N23/2251 (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms): 1 patents
  • G06T7/001 ({using an image reference approach}): 1 patents
  • G01N2223/401 (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms): 1 patents
  • G06T2207/10061 (Image acquisition modality): 1 patents
  • G06T2207/20081 (Special algorithmic details): 1 patents
  • G06T2207/20084 (Special algorithmic details): 1 patents
  • G06T2207/30148 (Subject of image; Context of image processing): 1 patents
  • G06N20/00 (Machine learning): 1 patents

Companies

File:Maxim PISARENCO Top Companies.png

List of Companies

  • ASML Netherlands B.V.: 2 patents

Collaborators

Subcategories

This category has the following 3 subcategories, out of 3 total.

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